Crop Model Products

Crop Model

The EPIC crop growth and yield model ( Williams et al., 1984; Doraiswamy et al., 2003) was selected to simulate the crop growth and development of winter wheat in Oklahoma. The EPIC model is a mechanistic model that describes the potential growth of crops as a function of solar irradiance, air temperature, precipitation and crop characteristics. The model has evolved over the several decades into a widely use model and has gone through rigorous testing under various environmental conditions for crop yield simulation for crops that include winter wheat and spring wheat. In this research, the model simulated LAI (leaf area index) will be adjusted by the real-time LAI derived from MODIS imagery. A radiative transfer model will be used to derive regional LAI throughout the crop season from the MODIS-250m reflectance data. Ground based LAI measurements will be used to adjust the radative transfer model parameters for winter wheat crop. The model simulations will be conducted at a spatial resolution of 1.6 km2 grid over the study area and the final results will be a winter wheat yield map.

References

• Doraiswamy, P.C., J.L. Hatfield, T.J. Jackson, B. Akhmedov, J. Prueger, A. Stern, 2004. Crop condition and yield simulations using Landsat and MODIS. Remote Sensing of Environment 92, 548-559
• Doraiswamy, P.C., S. Moulin, P.W. Cook and A. Stern, 2003. Crop yield assessment from remote sensing. PE&RS, 69:665-674
• Williams, J.R., C.A. Jones, and P.T. Dyke, 1984. A modeling approach to determining the relationship between erosion and soil productivity. Transactions of the ASAE, 27:129-144